Journal
HIGH ENERGY DENSITY PHYSICS
Volume 6, Issue 1, Pages 109-112Publisher
ELSEVIER
DOI: 10.1016/j.hedp.2009.05.017
Keywords
XUV spectroscopy; VUV-FEL; Warm dense plasma
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Funding
- EPSRC [EP/G007462/1, EP/F020449/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/F020449/1, EP/G007462/1] Funding Source: researchfish
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The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 10(16) W cm(-2) at a wavelength of 13.5 nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the range 5-8 eV with electron density in the range 10(21)-10(22) cm(-3). These results are consistent with the saturation of absorption through bleaching of the L-edge by intense photo-absorption reported in an earlier publication. (C) 2009 Elsevier B.V. All rights reserved.
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