Journal
IEEE PHOTONICS JOURNAL
Volume 3, Issue 3, Pages 476-488Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOT.2011.2148194
Keywords
Chirp; electroabsorption modulators; linewidth enhancement factor; optical modulation; semiconductor lasers
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In this paper, a technique based on the use of a Mach-Zehnder (MZ) interferometer is proposed to evaluate chirp properties, as well as the linewidth enhancement factor (alpha(H)-factor) of optoelectronic devices. When the device is modulated, this experimental setup allows the extraction of the component's response of amplitude modulation (AM) and frequency modulation (FM) that can be used to obtain the value of the alpha(H)-factor. As compared with other techniques, the proposed method gives also the sign of the alpha(H)-factor without requiring any fitting parameters and, thus, is a reliable tool, which can be used for the characterization of high-speed properties of semiconductor diode lasers and electroabsorption modulators. A comparison with the widely accepted fiber transfer function method is also performed with very good agreement.
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