Journal
IEEE JOURNAL OF PHOTOVOLTAICS
Volume 5, Issue 6, Pages 1591-1594Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2015.2478026
Keywords
Charge carriers; silicon solar cells; solar cell simulation; surface passivation
Funding
- Australian Renewable Energy Agency
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This paper explores the application of transparent MoOx (x<3) films as hole-collecting contacts on the rear side of crystalline silicon solar cells. Two dimensional simulations, which consider experimental contact recombination J(0c) and resistivity rho c values, indicate that the benefits of direct MoOx-based contacts are best exploited by reducing the rear contact fraction. This concept is demonstrated experimentally using simple p-type cells featuring a similar to 5% rear fraction MoOx contact. These cells attain a conversion efficiency of 20.4%, a promising result, given the early stage of development for this technology.
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