Journal
ULTRAMICROSCOPY
Volume 127, Issue -, Pages 100-108Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2012.07.006
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The problem of electron-beam damage in the transmission electron microscope is reviewed, with an emphasis on radiolysis processes in soft materials and organic specimens. Factors that determine the dose-limited resolution are identified for three different operational modes: bright-field scattering-contrast, phase-contrast and dark-field microscopy. Methods of reducing radiation damage are discussed, including low-dose techniques, cooling or encapsulating the specimen, and the choice of imaging mode, incident-beam diameter and incident-electron energy. Further experiments are suggested as a means of obtaining a better understanding and control of electron-beam damage. (c) 2012 Elsevier B.V. All rights reserved.
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