Journal
ULTRAMICROSCOPY
Volume 123, Issue -, Pages 90-98Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2012.04.004
Keywords
STEM; ADF imaging; EELS; Aberration correction; Single atomimaging; Single atomspectroscopy
Categories
Funding
- Division of Materials Sciences and Engineering, Basic Energy Sciences, of the US Department of Energy
Ask authors/readers for more resources
Some four decades were needed to catch up with the vision that Albert Crewe and his group had for the scanning transmission electron microscope (STEM) in the nineteen sixties and seventies: attaining 0.5 angstrom resolution, and identifying single atoms spectroscopically. With these goals now attained, STEM developments are turning toward new directions, such as rapid atomic resolution imaging and exploring atomic bonding and electronic properties of samples at atomic resolution. The accomplishments and the future challenges are reviewed and illustrated with practical examples. (C) 2012 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available