Journal
ULTRAMICROSCOPY
Volume 123, Issue -, Pages 90-98Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2012.04.004
Keywords
STEM; ADF imaging; EELS; Aberration correction; Single atomimaging; Single atomspectroscopy
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Funding
- Division of Materials Sciences and Engineering, Basic Energy Sciences, of the US Department of Energy
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Some four decades were needed to catch up with the vision that Albert Crewe and his group had for the scanning transmission electron microscope (STEM) in the nineteen sixties and seventies: attaining 0.5 angstrom resolution, and identifying single atoms spectroscopically. With these goals now attained, STEM developments are turning toward new directions, such as rapid atomic resolution imaging and exploring atomic bonding and electronic properties of samples at atomic resolution. The accomplishments and the future challenges are reviewed and illustrated with practical examples. (C) 2012 Elsevier B.V. All rights reserved.
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