4.4 Article Proceedings Paper

Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laser

Journal

ULTRAMICROSCOPY
Volume 111, Issue 6, Pages 589-594

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2010.12.011

Keywords

Laser assisted atom probe; Femtosecond laser; Rare-earth doped ceria

Categories

Funding

  1. CREST-JST
  2. World Premier International Research Center Initiative (WPI Initiative) on Materials Nanoarchitronics, MEXT, Japan
  3. [21560706]
  4. Grants-in-Aid for Scientific Research [21560706] Funding Source: KAKEN

Ask authors/readers for more resources

We have investigated the irradiation conditions of femtosecond laser pulses for quantitative atom probe analyses of rare-earth (RE) doped ceria. The influence of laser wavelength, power, pulse frequency, as well as specimen temperature on mass resolution and background noise of atom probe mass spectra were investigated. Furthermore, quantitative atom probe analysis of yttrium distribution in Y-doped ceria was carried out with the optimized evaporation conditions. The distribution of yttrium was found to be uniform within the grains, but they were confirmed to be segregated at grain boundaries. (C) 2010 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.4
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available