4.4 Article

The beam divergence of an indium LMIS at a distance of 50 μm as determined by plasma diagnostic measurements

Journal

ULTRAMICROSCOPY
Volume 111, Issue 8, Pages 969-972

Publisher

ELSEVIER
DOI: 10.1016/j.ultramic.2011.01.040

Keywords

LMIS; FEEP; Field emission; Indium; Beam divergence; Charged particle optics; Propulsion; Plasma diagnostic

Categories

Ask authors/readers for more resources

The current-dependent beam divergence at a distance of 50 pm from an indium-liquid metal ion source is derived from experimental data obtained by measuring the beam spread with a 3D Plasma diagnostic system at a distance of 10 cm from the needle tip. The observed relationship between emission current and beam divergence in vicinity of the emitting needle is used to design a focusing electrode for a field-emission electric propulsion thruster operating at currents up to 150 mu A. Another application involves focused ion beam columns which may choose to forego a beam-limiting aperture, such as LMIS-based rapid machining tools with large beam currents. (C) 2011 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.4
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available