Journal
ULTRAMICROSCOPY
Volume 110, Issue 4, Pages 325-329Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2010.01.004
Keywords
X-ray optics; Wavefront characterization; Ptychography; Phase retrieval; Diffractive imaging
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Funding
- Fonds Quebecois de la recherche sur la nature et les technologies (FQRNT)
- DFG Cluster of Excellence Munich-Center for Advanced Photonics
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A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. (C) 2010 Elsevier B.V. All rights reserved.
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