Journal
ULTRAMICROSCOPY
Volume 110, Issue 9, Pages 1205-1214Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2010.04.016
Keywords
Tip scanning instrument design and characterization; Scanning tunneling microscopy (STM); Atomic force microscopy (AFM)
Categories
Funding
- Australian Research Council [DP0666620]
- Center for Complex Dynamic Systems and Control
- Nevada NASA Space Grant Consortium
- Australian Research Council [DP0666620] Funding Source: Australian Research Council
Ask authors/readers for more resources
A major disadvantage of scanning probe microscopy is the slow speed of image acquisition, typically less than one image per minute. This paper describes three techniques that can be used to increase the speed of a conventional scanning probe microscope by greater than one hundred times. This is achieved by the combination of high-speed vertical positioning, sinusoidal scanning, and high-speed image acquisition. These techniques are simple, low-cost, and can be applied to many conventional microscopes without significant modification. Experimental results demonstrate an increased scan rate from 1 to 200 Hz. This reduces the acquisition time for a 200 x 200 resolution image from 3 min to 1 s. (C) 2010 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available