Journal
ULTRAMICROSCOPY
Volume 110, Issue 12, Pages 1460-1464Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2010.09.001
Keywords
Graphene; Carbon nanoparticles; Scanning transmission electron microscopy
Categories
Funding
- UK Engineering and Physical Sciences Research Council
- National Natural Science Foundation of China [90606002, 11075076, 10775070]
- National Key Projects for Basic Research of China [2009CB930501, 2010CB923401]
- EPSRC [EP/G070326/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/G070326/1] Funding Source: researchfish
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Free-standing graphene sheets have been imaged by scanning transmission electron microscopy (STEM). We show that the discrete numbers of graphene layers enable an accurate calibration of STEM intensity to be performed over an extended thickness and with single atomic layer sensitivity. We have applied this calibration to carbon nanoparticles with complex structures. This leads to the direct and accurate measurement of the electron mean free path. Here, we demonstrate potentials using graphene sheets as a novel mass standard in STEM-based mass spectrometry. (C) 2010 Elsevier B.V. All rights reserved.
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