Journal
ULTRAMICROSCOPY
Volume 109, Issue 10, Pages 1245-1249Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2009.05.011
Keywords
Fourier-ratio deconvolution; Richardson-Lucy (RL) deconvolution; Electron energy-loss spectroscopy (EELS); Plural scattering; Surface plasmon; Bulk plasmon; Interface plasmon
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Funding
- National Institute for Nanotechnology and Natural Sciences and Engineering Research Council
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We discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation of interface energy-loss modes. We also demonstrate the use of a Bayesian-equivalent procedure based on the Richardson-Lucy algorithm. (C) 2009 Elsevier B.V. All rights reserved.
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