Journal
TRIBOLOGY LETTERS
Volume 50, Issue 1, Pages 49-57Publisher
SPRINGER/PLENUM PUBLISHERS
DOI: 10.1007/s11249-012-0072-z
Keywords
Molecular dynamics (MD) simulation; Atomic force microscopy (AFM); Atomic friction
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Funding
- U.S. National Science Foundation [CMMI 1068552, CMMI-1068741]
- Natural Sciences and Engineering Research Council (NSERC) of Canada
- Directorate For Engineering [1216441] Funding Source: National Science Foundation
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [1068741] Funding Source: National Science Foundation
- Div Of Civil, Mechanical, & Manufact Inn [1216441] Funding Source: National Science Foundation
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Molecular dynamics simulation and atomic force microscopy are used to study the nature of friction between nanoscale tips and graphite step edges. Both techniques show that the width of the lateral force peak as the probe moves up a step is directly correlated with the size and shape of the tip. The origin of that relationship is explored and the similarities and differences between the measurements and simulations are discussed. The observations suggest that the relationship between lateral force peak width and tip geometry can be used as a real-time monitor for tip wear during atomic scale friction measurements.
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