New Spectral Fitting Method for Full-Spectrum Solar-Induced Chlorophyll Fluorescence Retrieval Based on Principal Components Analysis

The full-spectrum Solar-Induced chlorophyll Fluorescence (SIF) within the 650-800 nm spectral region can provide important information regarding physiological and biochemical activities in vegetation. This paper proposes a new Full-spectrum Spectral Fitting Method (F-SFM) for the retrieval of SIF spectra based on Principal Components Analysis (PCA). Using F-SFM, both the full-spectrum reflectance and SIF within the 650-800 nm region were modeled by PCA based on a training dataset simulated by the Soil Canopy Observation, Photochemistry and Energy fluxes (SCOPE) model, and the weighting coefficients of the principal components were estimated by the least-squares fitting method. An iterative process was employed to improve the accuracy of the estimation of the reflectance. In each iteration, the SIF spectra retrieved from the last run were removed from the total upwelling radiance to minimize the small contribution of the SIF to the apparent reflectance outside the absorption bands. Then, the F-SFM algorithm was tested using both simulated and field-measured data with different Spectral Resolutions (SRs) and Signal-to-Noise Ratios (SNRs). For data with an SR of 0.3 nm and without noise, the Relative Root Mean Square Error (RRMSE) was less than 14% within the spectral region that was studied, and the peak-value ratio (SIF735/SIF685) was accurately estimated with an RRMSE of 3.56%. In addition, the F-SFM algorithm proved less sensitive to the SR than the three-band Fraunhofer Line Discrimination (3 FLD) and improved FLD (iFLD) methods. In the case of the field spectral data with SRs of 3 nm and 0.3 nm, the double-peak shape and the diurnal variation trend of the SIF spectra could be reasonably reconstructed by F-SFM, and the retrieved SIF values at the O-2-A and O-2-B bands were consistent with those retrieved by 3FLD from data with a high SR (0.3 nm) and SNR (1000). Therefore, the F-SFM method can provide full-spectrum SIF information with high accuracy even at relatively low SRs and SNRs, and shows promise for use in applications involving the SIF shape information.