Journal
TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA
Volume 21, Issue 3, Pages 482-487Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S1003-6326(11)60740-1
Keywords
Cu-Ni-Si alloy; microstructure; XRD line profile analysis; Materials Analysis Using Diffraction software
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Cold worked and annealed supersaturated Cu-2.65Ni-0.6Si and Cu-2.35Ni-0.6Si-0.6Cr alloys were studied. The microstructural parameters evolution, including crystallite size, root mean square strain and dislocation density was analyzed using Materials Analysis Using Diffraction software (MAUD). The parameters for both alloys have typical values of cold deformed and subsequently annealed copper based alloy. A net change of the crystallite size, root mean square strain and dislocation density values of the alloys aged at 450 degrees C for 2.5-3 h seems corresponding to the recovery and recrystallization processes. Addition of Cr as quaternary element did not lead to any drastic changes of post deformation or ageing microstructural parameters and hence of recovery-recrystallization kinetics.
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