4.4 Article

Sol-gel synthesis of nickel oxide thin films and their characterization

Journal

THIN SOLID FILMS
Volume 520, Issue 15, Pages 4835-4840

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2012.02.072

Keywords

NiO; Sol-gel method; Structural properties; Electrical properties; Optical properties

Funding

  1. DAE-BRNS [2010/37P/45/BRNS/1442]

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Sol-gel method has been employed for the synthesis of nanocrystalline nickel oxide (NiO). The NiO powders were sintered at 400-700 degrees C for 1 h in an air. Thin films of sintered powders were prepared on glass substrate using spin coating technique and changes in the structural, morphological, electrical and optical properties were studied. The structural and microstructural properties of nickel oxide films were studied by means of X-ray diffraction and field emission scanning electron microscopy. Structural analysis shows that all the films are crystallized in the cubic phase and present a random orientation. Surface morphology of the nickel oxide film consists of nanocrystalline grains with uniform coverage of the substrate surface with randomly oriented morphology. The electrical conductivity showed the semiconducting nature with room temperature electrical conductivity increased from 10(-4) to 10(-2) (Omega cm)(-1) after sintering. The electron carrier concentration (n) and mobility (mu) of NiO films annealed at 400-700 degrees C were estimated to be of the order of 1.30 to 3,75 x 10(19) cm(-3) and 1.98 to 4.20 x 10(-5) cm(2) V-1 s(-1). The decrease in the band gap energy from 3.86 to 3.47 eV was observed for NiO sintered between 400 and 700 degrees C. These mean that the optical quality of NiO films is improved by sintering. (c) 2012 Elsevier B.V. All rights reserved.

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