4.4 Article

Electrochromic properties of N-doped tungsten oxide thin films prepared by reactive DC-pulsed sputtering

Journal

THIN SOLID FILMS
Volume 519, Issue 10, Pages 3032-3036

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2010.12.017

Keywords

Tungsten oxide; Electrochromism; Structural properties; N-doping; DC-pulsed sputtering; Optical properties

Funding

  1. Science and Technology Department of Zhejiang Province of China [2008C31G3220006]

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In depositing nitrogen doped tungsten oxide thin films by using reactive DC-pulsed magnetron sputtering process, nitrous oxide gas (N2O) was employed instead of nitrogen (N-2) as the nitrogen dopant source. The nitrogen doping effect on the structural and electrochromic properties of WO3 thin films was investigated. X-ray diffraction (XRD) results show that the films are amorphous. Morphological images reveal that the films are characterized by a hybrid structure comprising nanoparticles embedded in amorphous matrix and open channels between the agglomerated nanoparticles, which promotes rapid charge transport through the film. Increasing the nitrogen doping concentration is found to decrease the nanoparticle size and the band gap energy. The electrochromic properties were studied using cyclic voltammetric and spectroeletrochemical techniques. The film with N content of similar to 5 at.% exhibits higher optical modulation and coloration efficiency as well as faster ion transport kinetics. The results reveal that electrochromic and lithium ion transport properties are moderately enhanced relative to the un-doped tungsten oxide thin films by appropriate content of dopant, due to the effects of nitrogen doping. (C) 2011 Elsevier B.V. All rights reserved.

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