Journal
THIN SOLID FILMS
Volume 518, Issue 14, Pages 3721-3724Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2009.10.010
Keywords
Pb(Zr0.5Ti0.5)O-3; Fe3O4; Composite films; Electrical properties; Magnetodielectric effect; Magnetoelectric effect; X-ray diffraction; Sol-gel deposition
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Funding
- State Key Development Program for Basic Research of China [2007CB924900]
- National Natural Science Foundation of China [60221502]
- Chinese Academy of Sciences [C2-30]
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About 1.05 mu m-thick Pb(Zr0.5Ti0.5)O-3 (Pit) films containing Fe3O4 nanoparticles were deposited on LaNiO3-coated silicon substrates through a sol-gel technique. Fe3O4 nanoparticles were effectively dispersed into Pit solution under the involvement of polyvinylpyrrolidone. X-ray diffraction confirmed the coexistence of Pit and Fe3O4 phases without other impurity phases. Scanning electron microscope revealed that the thick composite films possess well-defined and crack-free microstructure. The composite films exhibit good ferroelectric and ferromagnetic properties at room temperature. An obvious magnetodielectric effect has been demonstrated in the Pb(Zr0.5Ti0.5)O-3/Fe3O4 composite films. Magnetic field induced change in ferroelectric polarization loop may support the possible magnetoelectric coupling between PZT and Fe3O4 phases. (C) 2009 Elsevier B.V. All rights reserved.
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