4.4 Article Proceedings Paper

Morphological and structural characterization of Cu2ZnSnSe4 thin films grown by selenization of elemental precursor layers

Journal

THIN SOLID FILMS
Volume 517, Issue 7, Pages 2531-2534

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2008.11.034

Keywords

Cu2ZnSnSe4; CZTSe; Sputtering; Selenization; Thin films; Chalcogenides; Chalcopyrites; Kesterites

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Despite the success of Cu(In,Ga)Se-2 (CIGS) based PV technology now emerging in several industrial initiatives. concerns about the cost of In and Ga are often expressed. It is believed that the cost of those elements will eventually limit the cost reduction of this technology. One candidate to replace CIGS is Cu2ZnSnSe4 (CZTSe). We report the preliminary results of CZTSe thin films grown on bare and Mo coated glass through selenization of DC magnetron sputtered Cu/Zn/Sn precursor layers in an atmosphere of Se vapour. The influence of the selenization temperature on the resulting films has been studied. The resulting films were studied by SEM/EDS, XRD, and Raman scattering. (C) 2008 Elsevier B.V. All rights reserved.

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