Journal
THIN SOLID FILMS
Volume 517, Issue 24, Pages 6794-6797Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2009.05.037
Keywords
Defect visualization; Atomic layer deposition (ALD); Fluorescent tags; Thin film barriers
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Funding
- DARPA Center on Nanoscale Science and Technology [HR0011-06-1-0048]
- Air Force Office of Scientific Research
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Defects and cracks in thin film barriers that are coated on polymers allow the leakage of reactive species through the polymer substrate. Fluorescent tags have been developed to visualize defects and cracks in thin film barriers and to inspect rapidly the barrier quality with minimal sample preparation. For Al2O3 films with a thickness of 25 nm deposited on polyethylene naphthalate polymer substrates using atomic layer deposition techniques, the fluorescent tags have identified cracks similar to 20 nm in width after applied strain and have observed individual defects as small as similar to 200 nm in diameter. (C) 2009 Elsevier B.V. All rights reserved.
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