Journal
THIN SOLID FILMS
Volume 516, Issue 22, Pages 8064-8072Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2008.04.042
Keywords
Scanning probe tips; Raman spectroscopy; Field enhancement; Scanning Near-Field Optical Microscopy
Categories
Funding
- Region Champagne Ardenne
- Universite de Technologie de Troyes
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Tip-Enhanced Raman Spectroscopy is based on the field enhancement and confinement provided by sharp metallic lips, used to locally excite the Raman emission from molecules, crystals and nanostructures. This technique has recently demonstrated capabilities for nanometer scale optical resolution in Raman analysis and has enormous potential applications in nano- and bio-technologies. In this paper we describe the state-of-the-art experimental techniques, focusing the attention oil the strategies to reduce the far-field background, on new processes to fabricate sharp metallic tips and on the effect of the depolarization produced by metallic tips on Tip-Enhanced Raman spectra of bulk crystals. (C) 2008 Elsevier B.V. All rights reserved.
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