Journal
THIN SOLID FILMS
Volume 516, Issue 5, Pages 600-603Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2007.06.216
Keywords
crystallization; Raman scattering; secondary ion mass spectroscopy (SIMS); silicon; solar cells; microcrystalline; minority carrier lifetime; flash lamp annealing
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Polycrystalline silicon (poly-Si) films thicker than 1.5 mu m, consisting of dense small grains called nano-gain poly-Si (ngp-Si), are formed by flash lamp annealing (FLA) of amorphous silicon (a-Si) films prepared by catalytic chemical vapor deposition (Cat-CVD) method. Crystallinity of the ngp-Si films can be controlled by changing lamp irradiance. Secondary ion mass spectroscopy (SIMS) profiles of dopants in the ngp-Si films after FLA shows no serious diffusion. A minority carrier lifetime of over 5 Its is observed from these ngp-Si films after defect termination process using high pressure water vapor annealing (HPWVA), showing possibility of application for high-efficient thin film solar cells. (C) 2007 Elsevier B.V. All rights reserved.
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