Journal
THIN SOLID FILMS
Volume 517, Issue 2, Pages 874-877Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2008.07.008
Keywords
Hole transport; Hole trap; p-doped organic hole-transport layer; Thermally stimulated current; Field-effect transistor
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We investigated the relationship between the hole-transport and hole-trap characteristics of N,N'-diphenyl-N,N'-bis(1-naphthyl)-1,1'-biphenyl-4,4'-diamine (alpha-NPD) doped with p-type molecules of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F-4-TCNQ) at various concentrations. The results of our current density-voltage, field-effect transistor, and thermally stimulated current studies revealed that the current densities of hole-only alpha-NPD devices at a certain driving voltage increased in the F-4-TCNQ concentration region between 0 mol% and 3 mol% due to the generation of free holes while the hole mobilities of the alpha-NPD layers decreased due to an increase in hole-trap concentration and deepened hole-trap energy levels, which were caused by the F-4-TCNQ doping. The optimized doping concentration of F-4-TCNQ was 3 mol%, which provided the highest current density for the hole-only device. On the other hand, since the increase in free-hole concentration was overcome by the decrease in hole mobility, the current density of the hole-only device decreased at the F-4-TCNQ concentration of 4 mol% when compared with the optimized concentration. (C) 2008 Elsevier B.V. All rights reserved.
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