Journal
SYNTHETIC METALS
Volume 161, Issue 23-24, Pages 2540-2543Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.synthmet.2011.09.013
Keywords
Ellipsometry; Effective medium approximation; Morphology; Degradation; Polymer; Fullerene
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We apply spectral ellipsometry (SE) to analyze the in-depth morphology of a polymer/fullerene film. Observed fullerene concentration gradients within the film are investigated with respect to temporal changes. The changes within the fractional composition of the polymer/fullerene film are resolved and can be correlated to the formation of fullerene segregations near the surface. (C) 2011 Elsevier B.V. All rights reserved.
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