4.5 Article

Electric field and grain size dependence of Meyer-Neldel energy in C60 films

Journal

SYNTHETIC METALS
Volume 161, Issue 17-18, Pages 1987-1990

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.synthmet.2011.07.008

Keywords

Organic field effect transistors; Charge carrier mobility; Meyer-Neldel rule; Charge transport; Film morphology; Grain size

Funding

  1. Ministry of Education and Science of Ukraine [M/125-2009]
  2. Austrian Science Foundation [S9706, S9711]
  3. Science &Technology Center in Ukraine [5258]
  4. OAD Project [UA-10/2009]

Ask authors/readers for more resources

Meyer-Neldel rule for charge carrier mobility measured in C-60-based organic field-effect transistors (OFETs) at different applied source drain voltages and at different morphologies of semiconducting fullerene films was systematically studied. A decrease in the Meyer-Neldel energy E-MN from 36 meV to 32 meV was observed with changing electric field in the channel. Concomitantly a decrease from 34 meV to 21 meV was observed too by increasing the grain size and the crystallinity of the active C-60 layer in the device. These empiric findings are in agreement with the hopping-transport model for the temperature dependent charge carrier mobility in organic semiconductors with a Gaussian density of states (DOS). Experimental results along with theoretical descriptions are presented. (C) 2011 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available