Journal
SYNTHETIC METALS
Volume 159, Issue 21-22, Pages 2225-2228Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.synthmet.2009.07.032
Keywords
PEDOT/PSS; Colloidal dispersion; Thin film; XPS; STEM/TEM; AFM
Funding
- Murata Science Foundation
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We have investigated effect of solvent on poly(3,4-ethylenedioxythiophene)/poly(4-styrenesulfonate) (PEDOT/PSS) nanometer-scaled thin films by means of a scanning transmission electron microscopy (STEM), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) in terms of thickness and PEDOT:PSS ratio of the films. As a result, the PEDOT:PSS ratio, surface roughness, number of highly conductive grain, and thickness of the PEDOT/PSS thin film coincidently increased with the addition of ethylene glycol (EG). It suggests that primary nanoparticles decrease in size but aggregate by removing excess PSS after the addition of the EG. (C) 2009 Elsevier B.V. All rights reserved.
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