4.7 Review

Recent progress on sum-frequency spectroscopy

Journal

SURFACE SCIENCE REPORTS
Volume 69, Issue 2-3, Pages 105-131

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.surfrep.2014.05.001

Keywords

Second harmonic generation; Sum frequency spectroscopy; Surface and interface

Funding

  1. NSFC, China [11374064, 11290161, 11104034]
  2. Shanghai Pujiang Program [12PJ1400900]
  3. Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy, United States [DE-AC03-76SF00098]

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Second harmonic generation (SHG) and sum frequency spectroscopy (SFS) have provided unique opportunities to probe surfaces and interfaces. They have found broad applications in many disciplines of science and technology. In recent years, there has been significant progress in the development of SHG/SFS technology that has significantly broadened the applications of SHG and SFS. In this article, we review the recent progress of the field with emphasis on SFS. (C) 2014 Elsevier B.V. All rights reserved.

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