Journal
SURFACE SCIENCE
Volume 610, Issue -, Pages 53-58Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2013.01.005
Keywords
Graphene; Mica; ABC stacking fault; Scanning tunneling microscopy; Scanning tunneling spectroscopy
Categories
Funding
- DFG [Mo858/11-1, Mo858/8-2]
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Graphene flakes are prepared on freshly cleaved mica by exfoliation and studied by scanning tunneling microscopy in ultra high vacuum. On few-layer graphene, a triangular network of partial dislocations separating ABC stacked and ABA stacked graphene was found similar to the networks occasionally visible on freshly cleaved HOPG. We found differences in the electronic structure of ABC and ABA stacked areas by scanning tunneling spectroscopy, i.e., a pronounced peak at 0.25 eV above the Fermi level exclusively in the ABA areas, which is shown to be responsible for the different apparent heights observed in STM images. (C) 2013 Elsevier B.V. All rights reserved.
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