In situ scanning electron microscopy of graphene growth on polycrystalline Ni substrate

Scanning electron microscopy (SEM) is shown to be capable of imaging a monolayer of graphene, and is employed to observe in situ the graphene growth process by segregation of bulk-dissolved carbon on a polycrystalline nickel surface. Because of a wide field of view, SEM could easily track the rapid graphene growth induced by carbon segregation. Monolayer graphene extended on (111)- and (011)-oriented nickel grains, but was excluded from the (001) grains. This is due to the difference in carbon-nickel binding energy among these crystalline faces. This work proves the usefulness of in situ SEM imaging for the investigation of large area graphene growth. (C) 2012 Elsevier By. All rights reserved.