Journal
SURFACE SCIENCE
Volume 605, Issue 23-24, Pages 2025-2031Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2011.07.022
Keywords
Field evaporation; Atom-probe tomography; Nano-analysis; Atomic scale imaging
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Funding
- Region Haute Normandie
- French National Research Agency (ANR) [ANR-08-027-01]
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The temperature effects on the field evaporation of atoms from a field emitter are numerically investigated by modeling the distribution of the electric field across the specimen surface. The field evaporation is described as an Arrhenius process with a field dependent activation barrier. The model can reproduce the experimentally observed dependence of the mean evaporation field with the temperature. It brings a new insight on the field distribution almost not accessible experimentally. A variation of the number of surface atoms really involved in the process at different temperatures is shown. This incorporation of the temperature in the model leads to a change in the order of field evaporation, causing a loss of spatial resolution that is estimated as a function of the tip temperature. (C) 2011 Elsevier B.V. All rights reserved.
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