Journal
SURFACE SCIENCE
Volume 605, Issue 23-24, Pages 1979-1985Publisher
ELSEVIER
DOI: 10.1016/j.susc.2011.07.016
Keywords
Ionic liquid; XPS; Activated carbon; Charging; Binding energies; Sensitivity factors
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Herein we report on XPS measurements on five different [EMIM] based ionic liquids (IL) prepared on activated carbon and aluminium supports. The anions were [TFSI] [BF4], [FAP], [B(CN)(4)] and [EtOSO3]. The results show that impurities such as O, Si or hydrocarbons were significantly reduced or no longer detected when preparation was performed on the high surface area carbon support. All core level spectra were fitted and for [EMIM][FAP], [EMIM][B(CN)(4)] and [EMIM][EtOSO3] de-convolution procedures of the C 1s lines are suggested. Comparison of the determined binding energies with published data strongly suggests that sample charging is irrelevant when preparation is performed on the activated carbon support. This observation is supposed to refer to the high capacitance of the high surface area carbon. (C) 2011 Elsevier B.V. All rights reserved.
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