Journal
SURFACE SCIENCE
Volume 602, Issue 4, Pages 871-875Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2007.12.026
Keywords
indium nitride; X-ray photoelectron spectroscopy; conduction band plasmon; core-level lineshape; electron accumulation
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Funding
- Engineering and Physical Sciences Research Council [EP/E031595/1, EP/G004447/1, EP/C535553/1] Funding Source: researchfish
- EPSRC [EP/G004447/1, EP/E031595/1] Funding Source: UKRI
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The core-level lineshape in photoemission spectra of InN is studied by high-resolution X-ray photoemission spectroscopy. The In 3d and N 1s core-levels are asymmetric, displaying a high binding energy tail which is attributed to inelastic losses to and/or screening by conduction band plasmons in the accumulation layer present at InN surfaces. The extent of the asymmetric tail decreases with decreasing surface Fermi level position associated with a lower density of electrons in the accumulation layer. (C) 2008 Elsevier B.V. All rights reserved.
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