Epitaxial growth of hexadecafluorozincphthalocyanine (F16ZnPc) film deposited on GeS(001)

The molecular arrangement in the monomolecular layer (1ML) film of hexadecafluorozincphthalocyanine (F16ZnPc) vacuum-deposited on GeS(00 1) in ultrahigh vacuum were studied by low energy electron diffraction (LEED), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS). From the LEED analysis, we found that the F16ZnPc film grows epitaxially on the substrate surface and that the lattice structure in the 1 ML region is commensurate with the lattice of the surface. The tilt angle between the molecular plane and the substrate surface is 12.5 degrees +/- 2.5 degrees deduced from the NEXAFS and ARUPS results. We also determined the azimuthal angle of the adsorbed F16ZnPc molecule with respect to the surface orientation of GeS(001) by comparing the ARUPS spectra with the theoretical simulation. Finally, we suggested a possible full film structure. (c) 2008 Elsevier B.V. All rights reserved.