Related references
Note: Only part of the references are listed.Peptide dissociation patterns in secondary ion mass spectrometry under large argon cluster ion bombardment
Hubert Gnaser et al.
RAPID COMMUNICATIONS IN MASS SPECTROMETRY (2013)
Development of gas cluster ion beam irradiation system with an orthogonal acceleration TOF instrument
K. Ichiki et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Structural characterization of synthetic polymers using thermal-assisted atmospheric pressure glow discharge mass spectrometry
Ning Zhang et al.
ANALYST (2012)
Depth profiling analysis of damaged arginine films with Ar cluster ion beams
J. Matsuo et al.
SURFACE AND INTERFACE ANALYSIS (2012)
Site-Specific Fragmentation of Polystyrene Molecule Using Size-Selected Ar Gas Cluster Ion Beam
Kousuke Moritani et al.
APPLIED PHYSICS EXPRESS (2009)
What size of cluster is most appropriate for SIMS?
Jiro Matsuo et al.
APPLIED SURFACE SCIENCE (2008)
Extremely low-energy projectiles for SIMS using size-selected gas cluster ions
Kousuke Moritani et al.
APPLIED SURFACE SCIENCE (2008)
Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions
Satoshi Ninomiya et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS (2007)
Depth profiling using C60+SIMS -: Deposition and topography development during bombardment of silicon
Greg Gillen et al.
APPLIED SURFACE SCIENCE (2006)
Share Paper
