Related references
Note: Only part of the references are listed.Analysis of organic multilayers and 3D structures using Ar cluster ions
E. Niehuis et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Dual beam depth profiling of polymer materials: comparison of C60 and Ar cluster ion beams for sputtering
D. Rading et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Surface spectrometry using large argon clusters
S. Kayser et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Development of gas cluster ion beam irradiation system with an orthogonal acceleration TOF instrument
K. Ichiki et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
Alexander G. Shard et al.
ANALYTICAL CHEMISTRY (2012)
Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS
M. P. Seah et al.
SURFACE AND INTERFACE ANALYSIS (2011)
MALDI Produced Ions Inspected with a Linear Ion Trap-Orbitrap Hybrid Mass Analyzer
Kerstin Strupat et al.
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY (2009)
Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams
Satoshi Ninomiya et al.
RAPID COMMUNICATIONS IN MASS SPECTROMETRY (2009)
C60 Secondary Ion Mass Spectrometry with a Hybrid-Quadrupole Orthogonal Time-of-Flight Mass Spectrometer
Anthony Carado et al.
ANALYTICAL CHEMISTRY (2008)
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
Alexander G. Shard et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2008)
Molecular depth profiling with cluster ion beams
J Cheng et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2006)