Journal
SURFACE AND INTERFACE ANALYSIS
Volume 44, Issue 11-12, Pages 1538-1541Publisher
WILEY
DOI: 10.1002/sia.4995
Keywords
graphene; thickness contrast; SEM; work function
Categories
Funding
- National Research Foundation of Korea
- Korea government (MEST) [2011-0019984]
- CCRF at Sungkyunkwan University
Ask authors/readers for more resources
We observed graphene flakes on a SiO2/Si substrate and confirmed the variation in the thickness of the flakes by optical microscopy, Raman spectroscopy and scanning electron microscopy (SEM). We were able to clearly distinguish the thickness variation of the graphene provided a low primary electron acceleration voltage was used. It was found that different contrasts in SEM images at low acceleration voltages could be attributed to the fact that the generation of secondary electrons emitted from the graphene was affected by the different work functions that corresponded to the number of graphene layers. Copyright (C) 2012 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available