4.2 Article

Modeling of PEG grafting and prediction of interfacial force profile using X-ray photoelectron spectroscopy

Journal

SURFACE AND INTERFACE ANALYSIS
Volume 44, Issue 2, Pages 144-149

Publisher

WILEY-BLACKWELL
DOI: 10.1002/sia.3783

Keywords

poly(ethylene glycol); PEG grafting; Langmuir isotherm; Langmuir-Freundlich isotherm; XPS; force profile

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Poly(ethylene glycol) (PEG)-grafted Sephadex (TM) derivatives were prepared by a covalent amine conjugation method and characterized using XPS. PEG-grafting kinetics were studied using both Langmuir and Langmuir-Freundlich isotherm models by correlating fractional C-O intensities obtained from high-resolution C 1s scans with the grafting period. Theoretical values were compared with experimental results to confirm the reliability of the modeling predictions. Detailed surface characterization of PEG-grafted Sephadex derivatives was performed using XPS data, and the results were used to predict the interaction free energy and stick force exerted at the matrix interface. Copyright (C) 2011 John Wiley & Sons, Ltd.

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