Related references
Note: Only part of the references are listed.Strong-field ionization of sputtered molecules for biomolecular imaging
D. Willingham et al.
CHEMICAL PHYSICS LETTERS (2009)
A simple erosion dynamics model of molecular sputter depth profiling
Andreas Wucher
SURFACE AND INTERFACE ANALYSIS (2008)
Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry
Emrys A. Jones et al.
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY (2007)
Molecular depth profiling with cluster ion beams
J Cheng et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2006)