Journal
SURFACE AND INTERFACE ANALYSIS
Volume 43, Issue 1-2, Pages 261-264Publisher
WILEY-BLACKWELL
DOI: 10.1002/sia.3537
Keywords
ToF-SIMS imaging; principal component analysis; image contrast; depth profile; surface analysis
Categories
Funding
- NIH [EB-002027, EB-001473]
Ask authors/readers for more resources
Imaging time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to study protein bound to a photolithographically patterned, commercial poly(ethylene glycol) (PEG)-based polymer film. The effect of different ion sources on the fragmentation pattern from this sample was analyzed with respect to the surface sensitivity of characteristic protein fragments and contrast in the ion images. The method demonstrates that, under similar fluence (below the static limit), Bi-3(+) provides better surface sensitivity for low mass fragments, and the best image contrast, as compared to Bi-1(+) and C-60(+) ion sources. Principal component analysis (PCA) was utilized to process depth profiles for this sample and shows that a primary ion fluence of approximately 20 x 10(12) ions/cm(2) is required to etch through the adsorbed protein layer. Copyright (C) 2010 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available