Journal
SUPERLATTICES AND MICROSTRUCTURES
Volume 45, Issue 4-5, Pages 206-213Publisher
ACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD
DOI: 10.1016/j.spmi.2008.11.008
Keywords
Cathodoluminescence spectroscopy; ZnO; Defects; Surface; Interface; Scanning electron microscope; Atomic force microscopy; Kelvin probe force microscopy
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Funding
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [0803276] Funding Source: National Science Foundation
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The electronic properties of ZnO surfaces and interfaces has until recently been relatively unexplored. We have used a complement of ultrahigh vacuum scanning electron microscope (SEM)-based, depth-resolved cathodoluminescence spectroscopy (DRCLS), temperature-dependent charge transport, trap spectroscopy, and surface science techniques to probe the electronic and chemical properties of clean surfaces and interfaces on a nanometer scale. DRCLS reveals remarkable nanoscale correlations of native point defect distributions with surface and sub-surface defects calibrated with capacitance trap spectroscopies, atomic force microscopy, and Kelvin probe force microscopy. The measurement of these near-surface states associated with native point defects in the ZnO bulk and those induced by interface chemical bonding is a powerful extension of cathodoluminescence spectroscopy that provides a guide to understanding and controlling ZnO electronic contacts. (c) 2008 Elsevier Ltd. All rights reserved.
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