Journal
SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY
Volume 75, Issue 1, Pages 69-73Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.saa.2009.09.041
Keywords
Crystal growth; X-ray diffraction; FTIR; Photoluminescence; Dielectric properties
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Funding
- Department of Science and Technology, New Delhi, India [ref-SR/FTP/PS-20/2005]
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The large size 20 mm diameter naphthalene single crystals were grown by modified vertical Bridgman method. The optical quality of the grown crystal was analyzed by photoluminescence and ultraviolet visible absorption spectral measurements. Photoluminescence spectrum indicated violet emission at 410 nm. The UV-vis absorption spectrum shows the maximum at 219.32 nm. The microhardness measurements and differential thermal analysis performed to analyze the mechanical and thermal stability of the as grown crystals. The dielectric measurements were carried out at five frequencies, viz., 100 Hz, 1 kHz, 10 kHz, 100 kHz and 1 MHz and at various temperatures, ranging from 308 K to 348 K indicate an increase of the dielectric parameters with the increase of temperature at all the five frequencies. The conductivity of the material is understood to be more of electronic in nature. Also, the increase in the dielectric parameters with that of temperature is due to the temperature variation of electronic polarizability. (C) 2009 Elsevier B.V. All rights reserved.
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