Journal
SOLID-STATE ELECTRONICS
Volume 61, Issue 1, Pages 116-120Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.sse.2011.03.010
Keywords
Si; Transparent conductive oxide; Schottky diode; Thermionic emission
Funding
- National Science Council of Taiwan [97-2628-M-018-001-MY3]
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In this study, the current-voltage characteristics of the AlCdO/unpolished p-type Si and AlCdO/polished p-type Si Schottky diodes with and without light illumination were examined. It is found that the Schottky barrier height (the series resistance) of the AlCdO/unpolished p-type Si Schottky diode is higher (lower) than that of the AlCdO/polished p-type Si Schottky diode. The power conversion efficiency of the AlCdO/p-type Si devices in the light (AM 1.5 G, 100 mW/cm(2)) was improved by increasing built-in potential at the AlCdO/p-type Si interfaces and reducing the device series resistance and surface reflectivity. It is shown that the device surface roughness plays an essential role in improving the device performance. (C) 2011 Elsevier Ltd. All rights reserved.
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