Journal
SOLID-STATE ELECTRONICS
Volume 54, Issue 10, Pages 1119-1124Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.sse.2010.05.019
Keywords
III-Nitride; InGaN QWs; Light-emitting diodes; Efficiency-droop
Funding
- Directorate For Engineering
- Div Of Electrical, Commun & Cyber Sys [GRANTS:13801134] Funding Source: National Science Foundation
- Div Of Electrical, Commun & Cyber Sys
- Directorate For Engineering [1028490] Funding Source: National Science Foundation
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Current injection efficiency and its impact on efficiency-droop in InGaN single quantum well (QW) based light-emitting diodes (LEDs) are investigated. The analysis is based on current continuity relation for drift and diffusion carrier transport across the QW-barrier system. A self-consistent 6-band k . p method is used to calculate the band structure for InGaN QW. The analysis indicates that the internal quantum efficiency in the conventional 24-angstrom In0.28Ga0.72N-GaN QW structure reaches its peak at low injection current density and reduces gradually with further increase in current due to the large carrier thermionic emission. Structures combining 24-angstrom In0.28Ga0.72N QW with 15-angstrom Al0.1Ga0.9N barriers show slight reduction in quenching of the injection efficiency as current density increases. The use of 15-angstrom Al0.83In0.17N barriers shows significant reduction in efficiency-droop (10% reduction of the internal quantum efficiency at current density of 620 A/cm(2)). Thus, InGaN QWs employing thin layers of larger bandgap AlInN barriers suppress the efficiency-droop phenomenon significantly. (C) 2010 Elsevier Ltd. All rights reserved.
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