4.5 Article

Stabilization of the delta-phase in Bi2O3 thin films

Journal

SOLID STATE IONICS
Volume 255, Issue -, Pages 147-152

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ssi.2013.12.027

Keywords

Bismuth oxide; Sputtering; Thin films; Thermal stability

Funding

  1. European Community [263878]
  2. CONACYT, (BisNano) [125141]

Ask authors/readers for more resources

In this paper, we report the stabilization of the delta-phase of Bi2O3 thin films from room temperature (RT) to 500 degrees C by the addition of tantalum ions. The delta-Bi2O3 phase is the material presenting the highest ionic conductivity; as bulk it is stable in a reduced temperature range from 730 to 825 degrees C, while the alpha-phase is the RT stable phase. However, when produced by atomic aggregation methods as a nanometric thin film, the delta-phase can be maintained at atmospheric conditions and it actually reverts to the alpha-phase only after thermal annealing, such transformation usually occurs around 250-350 degrees Cby passing through the beta-phase. In this work, we report that tantalum addition during the deposition of the Bi2O3 films by magnetron sputtering allows the maintenance of the delta phase up to 500 degrees C upon thermal annealing in air. (C) 2013 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available