4.7 Article

Electrochromism in sputter deposited nickel-containing tungsten oxide films

Journal

SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 99, Issue -, Pages 339-344

Publisher

ELSEVIER
DOI: 10.1016/j.solmat.2011.12.025

Keywords

Electrochromism; Tungsten oxide; Nickel oxide; Thin film; Impedance spectroscopy; Optical properties

Funding

  1. Clear-up (Clean and Resource Efficient Buildings for Real Life)
  2. European Community's Seventh Framework Programme (FP7/2007-2013) [211948]
  3. Swedish Research Council (VR)
  4. Swedish Research Council for Environment, Agriculture Sciences and Spatial Planning (FORMAS)

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Thin films of NixW1-x oxide were prepared by reactive DC magnetron co-sputtering and were investigated by optical and electrochemical measurements. Electrochromism was found only for 0 < x < 0.3 but not for 0.3 < x < 0.6, though films with x similar to 0.4 could still sustain reversible charge insertion. The coloration efficiency was largest for 0.10 < x <0.15. The charge capacity of the NixW1-x oxide films decreased upon increasing the value of x as a consequence of a decreasing ion diffusion coefficient leading to slower kinetics. (C) 2012 Elsevier B.V. All rights reserved.

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