Journal
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume 99, Issue -, Pages 182-189Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.solmat.2011.11.035
Keywords
Fullerenes; Photovoltaic devices; Solar cells; Thin films
Funding
- Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences Division of the U.S. Department of Energy [DE-FG02-07ER46391]
- Center for Advanced Molecular Photovoltaics (CAMP)
- King Abdullah University of Science and Technology (KAUST) [KUS-C1-015-21]
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The fracture resistance of P3HT:PC60BM-based photovoltaic devices are characterized using quantitative adhesion and cohesion metrologies that allow identification of the weakest layer or interface in the device structure. We demonstrate that the phase separated bulk heterojunction layer is the weakest layer and report quantitative cohesion values which ranged from similar to 1 to 20J m(-2). The effects of layer thickness, composition, and annealing treatments on layer cohesion are investigated. Using depth profiling and X-ray photoelectron spectroscopy on the resulting fracture surfaces, we examine the gradient of molecular components through the thickness of the bulk heterojunction layer. Finally, using atomic force microscopy we show how the topography of the failure path is related to buckling of the metal electrode and how it develops with annealing. The research provides new insights on how the molecular design, structure and composition affect the cohesive properties of organic photovoltaics. (C) 2011 Elsevier B.V. All rights reserved.
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