Journal
SMALL
Volume 8, Issue 5, Pages 682-686Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/smll.201101958
Keywords
atomic force microscopy; chalcogenides; layered materials; optical imaging; Raman spectroscopy
Categories
Funding
- MOE [MOE2010-T2-1-060]
- Singapore National Research Foundation
- NTU in Singapore [M58120031]