Journal
SMALL
Volume 8, Issue 8, Pages 1264-1269Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/smll.201101648
Keywords
atomic force microscopy; diamond; nanoparticles; phase imaging; scanning probe microscopy
Categories
Funding
- Office of Science
- Basic Energy Sciences Program
- Division of User Facilities
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [ERKCC61]
- U.S. National Science Foundation [CMMI-0854735]
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The cantilever dynamics in single-frequency scanning probe microscopy (SPM) are undefined due to having only two output variables, which leads to poorly understood image contrast. To address this shortcoming, generalized phase imaging scanning probe microscopy (GP-SPM), based on broad band detection and multi-eigenmode operation, is developed and demonstrated on diamond nanoparticles with different functionalization layers. It is shown that rich information on tipsurface interactions can be acquired by separating the response amplitude, instant resonance frequency, and quality factor. The obtained data allow high-resolution imaging even in the ambient environment. By tuning the strength of tipsurface interaction, different surface functionalizations can be discerned.
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