Journal
SMALL
Volume 8, Issue 1, Pages 53-58Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/smll.201101445
Keywords
nanocables; electrical transport properties; connectors; failure current density; nanoscale devices
Categories
Funding
- Natural Science Foundation of China [50901073, 90923033, 91022032, 50732006]
- Chinese Academy of Sciences, China
- National Basic Research Program of China [2011CB933700, 2010CB934700]
- International Science & Technology Cooperation Program of China [2010DFA41170]