Sensing characteristics of the organic vapors according to the reflectance spectrum in the porous silicon multilayer structure

We fabricated a porous silicon multilayer and investigated its reflectance spectra before, during, and after exposure to various organic vapors. During exposure of the porous silicon multilayer to isopropanol, ethanol, methanol, and acetone vapors, the reflectance peak shifted toward longer wavelengths by about 5, 12, 26, and 39 nm. respectively. The shift of the reflectance peak arises from refractive index changes induced by capillary condensation of the organic vapor in the pores of the porous silicon multilayer. In addition, we observed that the shift value of the reflectance peak increased with increasing organic solvent concentration in the organic solvent-water mixture. After removing the organic vapor, the reflectance spectrum returned completely to its original state. (C) 2010 Elsevier B.V. All rights reserved.