4.4 Article

Rare earth 4f hybridization with the GaN valence band

Journal

SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 27, Issue 11, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0268-1242/27/11/115017

Keywords

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Funding

  1. Defense Threat Reduction Agency (DTRA) [HDTRA1-07-1-0008, BRBAA08-I-2-0128]
  2. Nebraska Materials Science and Engineering Center [DMR-0820521]
  3. Institute for Functional Nanomaterials
  4. NASA-IDEA-PR
  5. Nebraska Research Initiative
  6. DOE [DE-EE0003174]
  7. Direct For Mathematical & Physical Scien
  8. Division Of Materials Research [0820521] Funding Source: National Science Foundation

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The placement of the Gd, Er and Yb 4f states within the GaN valence band has been explored by both experiment and theory. The 4d-4f photoemission resonances for various rare-earth(RE)-doped GaN thin films (RE = Gd, Er, Yb) provide an accurate depiction of the occupied 4f state placement within the GaN. The resonant photoemission show that the major Er and Gd RE 4f weight is at about 5-6 eV below the valence band maximum, similar to the 4f weights in the valence band of many other RE-doped semiconductors. For Yb, there is a very little resonant enhancement of the valence band of Yb-doped GaN, consistent with a large 4f(14-delta) occupancy. The placement of the RE 4f levels is in qualitative agreement with theoretical expectations.

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